RadTech, the Association for Ultraviolet and Electron Beam (UV+EB) technologies, announced newly elected Board members for a two-year term of 2024-2025:
Professor Christopher N. Bowman, the University of Colorado; Dr. Dianne Poster, United States Department of Commerce, National Institute of Standards and Technology; and Jeremy Smith, Corporate Innovation Office of Nagase Holdings America.
"With the continued rapid technical and market advancement of UV+EB technologies, we are pleased to welcome our new, outstanding board members," says Michael Gould, RadTech President, RAHN USA. "In 2024, the RadTech Board and membership will continue educational efforts to not only encourage the development of new materials, processes, and applications but to better inform policy makers, regulators, and the general public about the importance of UV+EB to advanced, responsible manufacturing."
RadTech thanked outgoing Board members, Evan Benbow of Nazdar and Karl Swanson of PCT Ebeam and Integration, for their leadership and service. Continuing RadTech Officers and Board members include: Michael Gould RAHN USA, President; Mike Bonner, St. Clair Systems, Incoming President; Susan Bailey, Michelman, Immediate Past President; Todd Fayne, PepsiCo, Secretary; Paul Elias, Miwon, Treasurer; David Biro, Sun Chemical; Neil Cramer, Sartomer; David Engberg, Perstorp; Jonathan Graunke, INX Intl; Jennifer Heathcote, GEW; Sudhakar Madhusoodhanan, Applied Materials; Eric Nelson, 3M; Jake Staples, Wausau Coated Products, Inc; Dan Theiss, Procter & Gamble; David Walker, PrintFoam.The2024 RadTech UV+EB Technology & Conference, will be held May 20-22, 2024 at the Hyatt Regency Orlando in Orlando, Florida, USA.
