The InTouchScope™ is an analytical low-vacuum scanning electron microscope (SEM) featuring integrated energy dispersive spectroscopy with the latest silicon drift detector technology.



JEOL: The InTouchScope™ is an analytical low-vacuum scanning electron microscope (SEM) featuring integrated energy dispersive spectroscopy with the latest silicon drift detector technology. Features include: automatic SEM condition setup based on sample type, simultaneous multiple live image and movie capture, easy sample navigation at 5x - 300,000x magnifications, quantitative and qualitative elemental analysis, low- and high-vacuum operation, and wireless capability.