www.pcimag.com/articles/102026-scanning-electron-microscope
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Scanning Electron Microscope

JEOL

May 2, 2016

JSM-IT100 is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design. Featuring expanded EDS analysis capabilities and ports for multiple detectors, it can be configured to meet individual lab requirements at an exceptional value.Call 978/535.5900.