www.pcimag.com/articles/102026-scanning-electron-microscope

Scanning Electron Microscope
JEOL
May 2, 2016
JSM-IT100 is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design. Featuring expanded EDS analysis capabilities and ports for multiple detectors, it can be configured to meet individual lab requirements at an exceptional value.Call 978/535.5900.